Alif Semiconductor /AE722F80F55D5AS_CM55_HP_View /CSI /CSI_PHY_TEST_CTRL1

Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text

Interpret as CSI_PHY_TEST_CTRL1

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0PHY_TESTDIN0PHY_TESTDOUT0 (PHY_TESTEN)PHY_TESTEN

Description

PHY Test Control 1 Register

Fields

PHY_TESTDIN

Test interface 8-bit data input for programming internal registers and accessing test functionalities.

PHY_TESTDOUT

Test interface 8-bit data output for reading data and other probing functionalities.

PHY_TESTEN

When asserted high, it configures an address write operation on the falling edge of TESTCLK. When asserted low, it configures a data write operation on the rising edge of TESTCLK.

Links

() ()